Skip to content

Article

Beyond CLIP: Calibrated Few-Shot Defect Detection With System One Decision Models

arXiv study applying Jev and Clef-Flash to manufacturing defect detection with as few as two reference images per class, including agentic refinement of text descriptions and probability calibration. Ships replication code, an R decisions package, and a no-code web app.
Format
Article
Reading time
2 min
Published by
Community
Added
Nov 2026

Highlights

  • Tests Jev and Clef-Flash on image inspection with as few as k=2 reference images per class at inference.
  • Jev reaches 0.75-1.00 test accuracy versus 0.67-0.84 for CLIP using the same references.
  • Agentic refinement of guiding text descriptions improved accuracy in 6 of 8 model-application combinations.
  • The calibration approach reduced the Brier score in 13 of 15 model-application configurations.
  • Findings cover five manufacturing case studies, plus replication code, an R decisions package, and a public web app.

Questions about this entry

Short answers drawn from the linked project or page.

From the Jev guides

Original write-ups on what this entry is for.

From the Jev AI model community

Posts from builders shipping with Jev right now.

Follow @typesafeai